Date of Announcement：2026/8/28

1、Technology：HYBRID POLARIZED DIGITAL HOLOGRAPHIC MICROSCOPY SYSTEM AND METHODS FOR 3D STRUCTURAL AND STRESS METROLOGY

2、Inventor：Prof. Liang-Chia Chen/Department of Mechanical Engineering, National Taiwan University

3、Enterprise Eligibility：

(1)Industry Category：Semiconductor Manufacturing, Precision Manufacturing

(2)Required Technical Know-how：Optical Measurement Technology

(3)Required Machinery and Equipment：None

(4)Required Research or Technical Staff：Optical Measurement Technology

(5)Other Requirements：None

4、How to apply：Please go to the Center of Industrial-Academic Cooperation of the Office of Research and Development to inquire about relevant information.

5、Announcement period：Applications will be accepted from the announcement date

6、Contact window:

Intellectual Property & Licensing Manager：Sierra Wang

TEL：+886-2-3366-9954

Email：sierrawang@ntu.edu.tw

7、Please refer to the attachment for the technical disclosure information of this case, and download the documents required for the application from the link (https://ord.ntu.edu.tw/w/ordntu/Alumnus_20072014421396936)